型號 |
廠商 |
描述 |
文檔 |
詢價 |
CD74AC283E |
TI(德州儀器) |
IC 4BIT BINARY FILL ADDER 16-DIP |
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|
MC100EP17DTG |
ON(安森美) |
IC RCVR/DRV ECL QUAD DFF 20TSSOP |
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CD74HCT283E |
TI(德州儀器) |
IC BIN FULL 4BIT ADD W/CAR 16DIP |
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|
SY54016RMG-TR |
Microchip(美國微芯) |
IC RCVR/LINE DVR CML LV 8-MLF |
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|
MAX19005CCS+ |
Maxim(美信) |
IC DCL QUAD 300MHZ ATE 80TQFP |
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|
ISL55100AIRZ-T7A |
Intersil(英特矽爾) |
IC COMP DRVR/WINDOW 18V 72QFN |
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SN74ABT18502PM |
TI(德州儀器) |
IC SCAN-TEST-DEV/TXRX 64-LQFP |
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SN74ABTH182646APM |
TI(德州儀器) |
IC SCAN-TEST-DEV/TXRX 64-LQFP |
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SN74ABT18646PM |
TI(德州儀器) |
IC SCAN-TEST-DEV/TXRX 64-LQFP |
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|
SN74ABT18652PM |
TI(德州儀器) |
IC SCAN-TEST-DEV/TXRX 64-LQFP |
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|
8V182512IDGGREP |
TI(德州儀器) |
IC ABT SCAN TEST DEV3.3V 64TSSOP |
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ISL55100BIRZ |
Intersil(英特矽爾) |
IC COMP DRVR/WINDOW 18V 72-QFN |
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SN74ABTH18652APM |
TI(德州儀器) |
IC SCAN-TEST-DEV/TXRX 64-LQFP |
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SN74ABTH18646APM |
TI(德州儀器) |
IC SCAN-TEST-DEV/TXRX 64-LQFP |
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|
SN74LVTH18652APM |
TI(德州儀器) |
IC TXRX/REG 18BIT 3.3V 64-LQFP |
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SN74LVTH182652APM |
TI(德州儀器) |
IC SCAN TEST DEVICE ABT 64-LQFP |
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|
SN74LVTH18646APM |
TI(德州儀器) |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
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|
CSSTV32867SGKEREP |
TI(德州儀器) |
IC REGISTERED BUFF 26BIT 96LFBGA |
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|
SN74ABT18504PM |
TI(德州儀器) |
IC SCAN-TEST-DEV/TXRX 64-LQFP |
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|
SN74LVT8996IPWREP |
TI(德州儀器) |
IC 10B ADDRSBL SCAN PORT 24TSSOP |
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|
74SSTVF32852ZKFR |
TI(德州儀器) |
IC RGSTRD BUFF 24-48BIT 114BGA |
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|
74SSTUB32868AZRHR |
TI(德州儀器) |
IC REGSTR BUFFER 28-56BIT 176BGA |
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|
SN74SSTU32864GKER |
TI(德州儀器) |
IC 25BIT CONFIG REG BUFF 96LFBGA |
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|
74SSTUB32865ZJBR |
TI(德州儀器) |
IC REGISTERED BUFFER 160-TFBGA |
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|
74SSTUB32865AZJBR |
TI(德州儀器) |
IC REGSTR BUFF 28-56BIT 160NFBGA |
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|
74SSTUB32868ZRHR |
TI(德州儀器) |
IC CONFIG REG BUFF 28BIT 176-BGA |
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|
SN74SSTU32864CZKER |
TI(德州儀器) |
IC 25BIT CONFIG REG BUFF 96-BGA |
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|
SN74SSTU32864ZKER |
TI(德州儀器) |
IC 25BIT CONFIG REG BUFF 96-BGA |
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|
SN74LVT8980AIDWREP |
TI(德州儀器) |
IC EMBEDDED TEST BUS CTRL 24SOIC |
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|
SN74ABT8652DL |
TI(德州儀器) |
IC SCAN-TEST-DEV/XCVR 28-SSOP |
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|
SN74ABT18640DL |
TI(德州儀器) |
IC SCAN-TEST-DEV/TXRX 56-SSOP |
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|
SN74ABTE16246DLR |
TI(德州儀器) |
IC 11-BIT I-WS BUS TXRX 48-SSOP |
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|
SN74ABT8543DW |
TI(德州儀器) |
IC SCAN TEST DEV/TXRX 28-SOIC |
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SN74SSTU32864DZKER |
TI(德州儀器) |
IC 25BIT CONFIG REG BUFF 96-BGA |
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|
SN74SSTV32852GKFR |
TI(德州儀器) |
IC BUFFER 24BIT-48BIT 114LFBGA |
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|
SN74SSTV32852ZKFR |
TI(德州儀器) |
IC BUFFER 24BIT-48BIT 114BGA |
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|
SN74LVT8986PM |
TI(德州儀器) |
IC LINK ADDRSS SCAN-PORT 64-LQFP |
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|
SN74LVT8996PWR |
TI(德州儀器) |
IC 10-BIT SCAN PORT XCVR 24TSSOP |
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|
SN74ABT18245ADLR |
TI(德州儀器) |
IC SCAN-TEST-DEV/TXRX 56-SSOP |
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|
SN74ABT8646DL |
TI(德州儀器) |
IC SCAN-TEST-DEV/XCVR 28-SSOP |
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|
SN74ABT8646DW |
TI(德州儀器) |
IC SCAN-TEST-DEV/XCVR 28-SOIC |
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|
SN74SSTEB32866ZWLR |
TI(德州儀器) |
IC BUFF CONFIG REG 25BIT 96BGA |
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|
CSSTV32852GKFREP |
TI(德州儀器) |
IC REGISTERED BUFF 114LFBGA |
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|
SN74ABT18245ADGGR |
TI(德州儀器) |
IC SCAN-TEST-DEV/TXRX 56-TSSOP |
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|
SN74LVTH182502APM |
TI(德州儀器) |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
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|
SN74LVTH18504APM |
TI(德州儀器) |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
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|
SN74LVTH18502APM |
TI(德州儀器) |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
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SN74SSTUB32864ZKER |
TI(德州儀器) |
IC CONFIG REG BUFF 25BIT 96-BGA |
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|
74SSTUB32866AZKER |
TI(德州儀器) |
IC CONFIG REG BUFF 25BIT 96-BGA |
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SN74SSTUB32866ZKER |
TI(德州儀器) |
IC CONFIG REG BUFF 25BIT 96-BGA |
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