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18665920580
| 型號(hào) | 廠商 | 描述 | 文檔 | 詢(xún)價(jià) |
| SN74ABT18502PMR | TI(德州儀器) | IC SCAN TEST DEVICE 18BIT 64LQFP |  |
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| SN74ABT18504PMG4 | TI(德州儀器) | IC SCAN TEST DEVICE 20BIT 64LQFP | |
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| MC100EP17DWR2G | ON(安森美) | IC RCVR/DRV ECL QUAD DIFF 20SOIC | |
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| SN74SSQE32882ZCJR | TI(德州儀器) | IC REG BUFF 28-56BIT 176BGA | |
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| LM9780CCVS/NOPB | TI(德州儀器) | NON-STANDARD PART CALL FIRST | |
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| SN74ABTE16246DLG4 | TI(德州儀器) | IC 11BIT I-WS BUS TXRX 48-SSOP | |
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| MC100EP116MNR4G | ON(安森美) | IC LINE RCVR/DRVR HEX DIFF 32QFN | |
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| SN74ABT8652DLG4 | TI(德州儀器) | IC SCAN TEST DEVICE 28-SSOP | |
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| MC10EP116FAR2G | ON(安森美) | IC RCVR/DRVR HEX 6BIT DFF 32LQFP | |
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| MC100EP116FAR2G | ON(安森美) | IC TCVR/DRVR HEX DIFF ECL 32LQFP | |
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| ISL55100BIRZ-T | Intersil(英特矽爾) | IC COMP DRVR/WINDOW 18V 72-QFN | |
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| SN74ABTE16245DLG4 | TI(德州儀器) | IC 16BIT I-WS BUS TXRX 48-SSOP | |
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| SN74ABT18245ADL | TI(德州儀器) | IC SCAN-TEST-DEV/TXRX 56-SSOP | |
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| SN74FB2033ARCRG3 | TI(德州儀器) | IC REGISTERED TXRX 8BIT 52QFP | |
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| SN74ABT8646DLG4 | TI(德州儀器) | IC SCAN TEST DEVICE 28-SSOP | |
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| SN74LVT8980ADW | TI(德州儀器) | IC TEST-BUS CONTROLLER 24-SOIC | |
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| SN74ABT8996DW | TI(德州儀器) | IC ADDRESSABLE SCAN PORT 24-SOIC | |
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| SN74ABT8996PW | TI(德州儀器) | IC ADDRESSABLE SCAN PORT 24TSSOP | |
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| SN74ACT8997DW | TI(德州儀器) | IC SCAN-PATH LINKER 28-SOIC | |
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| SN74LVT8996DW | TI(德州儀器) | IC 10-BIT SCAN PORT XCVR 24-SOIC | |
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| MC10EP17DWR2G | ON(安森美) | IC RCVR/DRVR QUAD ECL DFF 20SOIC | |
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| SN74BCT8245ADW | TI(德州儀器) | IC SCAN TEST DEVICE TXRX 24-SOIC | |
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| SN74BCT8244ADWE4 | TI(德州儀器) | IC SCAN TEST DEVICE BUFF 24-SOIC | |
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| SN74BCT8244ADW | TI(德州儀器) | IC SCAN TEST DEVICE BUFF 24-SOIC | |
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| MC10EP17MNTXG | ON(安森美) | IC RCVR/DRVR QUAD DIFF ECL 20QFN | |
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| MC100EP17MNTXG | ON(安森美) | IC RCVR/DRVR QUAD DIFF ECL 20QFN | |
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| MC10EP17DTR2G | ON(安森美) | IC RCVR/DRVR QUAD DIFF 20-TSSOP | |
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| NB100LVEP17MNR2G | ON(安森美) | IC DRVR ECL QUAD 2.5V/3.3V 24QFN | |
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| NB100LVEP17DTR2G | ON(安森美) | IC DRV/RCV ECL QUAD DIFF 20TSSOP | |
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| MC100EP17DTR2G | ON(安森美) | IC RCVR/DRV ECL QUAD DFF 20TSSOP | |
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| MC10EP16TDG | ON(安森美) | IC RCVR/DRVR ECL DIFF 5V 8SOIC | |
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| MC100EP16VTDG | ON(安森美) | IC RCVR/DRVR ECL DIFF VAR 8SOIC | |
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| MC100EP16TDG | ON(安森美) | IC RCVR/DRVR ECL DIFF 5V 8SOIC | |
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| SN74SSTVF32852KR | TI(德州儀器) | IC BUFFER 24BIT-48BIT 114LFBGA | |
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| MC10E416FNG | ON(安森美) | IC LINE RCVR QUINT DIFF 28-PLCC | |
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| MC100E116FNG | ON(安森美) | IC LINE RECEIVER QUINT 28-PLCC | |
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| MC10E116FNG | ON(安森美) | IC LINE RCVR QUINT ECL 5V 28PLCC | |
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| SN74BCT8373ADW | TI(德州儀器) | IC SCAN TEST DEVICE LATCH 24SOIC | |
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| NB7VPQ16MMNG | ON(安森美) | IC CML PRE-EMPH DRIVER 16QFN | |
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| NB7VPQ16MMNHTBG | ON(安森美) | IC CML DVR PRE-EMPH 1CH 16-QFN | |
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| MC10EP16TDTG | ON(安森美) | IC RCVR/DRVR ECL DIFF 5V 8TSSOP | |
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| MC100EP16VTDTG | ON(安森美) | IC RCVR/DRVR ECL DIFF VAR 8TSSOP | |
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| MC100EP16TDTG | ON(安森美) | IC RCVR/DRVR ECL DIFF 5V 8TSSOP | |
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| SN74LVT8986ZGV | TI(德州儀器) | IC LINK ADDRSS SCAN-PORT 64-BGA | |
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| SN74LVTH18504APMG4 | TI(德州儀器) | IC SCAN-TEST-DEV/XCVR 64-LQFP | |
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| SN74LVTH18502APMG4 | TI(德州儀器) | IC SCAN-TEST-DEV/XCVR 64-LQFP | |
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| SN74ACT8997DWR | TI(德州儀器) | IC SCAN-PATH LINKER 28-SOIC | |
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| MC10E416FNR2G | ON(安森美) | IC LINE RCVR QUINT DIFF 28-PLCC | |
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| MC10E116FNR2G | ON(安森美) | IC LINE RECEIVER QUINT 28-PLCC | |
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| MC100E116FNR2G | ON(安森美) | IC LINE RECEIVER QUINT 28-PLCC | |
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